Granted Patent
Utility
US 6,490,701 · App. 09/641,065
Integrated circuit test mode with externally forced reference voltage
Inventors:
Frankie F. Roohparvar, A. Papaliolios
Patented Case
View Patent ↗
Granted: Dec 3, 2002
Filed: Aug 17, 2000
Inventors
Frankie F. Roohparvar
A. Papaliolios
Assignee (at issue)
Micron Technology, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.