Granted Patent
Utility
US 6,496,027 · App. 08/916,994
System for testing integrated circuit devices
Inventors:
Joseph C. Sher, David D. Siek, Huy T. Vo, Nicholas Heel, Victor Wong, Hua Zheng
Patented Case
View Patent ↗
Granted: Dec 17, 2002
Filed: Aug 21, 1997
Inventors
Joseph C. Sher
David D. Siek
Huy T. Vo
Nicholas Heel
Victor Wong
Hua Zheng
Assignee (at issue)
Micron Technology, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.