Granted Patent
Utility
US 6,496,565 · App. 09/827,123
X-ray fluorescence analysis apparatus
Inventors:
Yoshiki Matoba, Mitsuo Naito
Patented Case
View Patent ↗
Granted: Dec 17, 2002
Filed: Apr 5, 2001
Inventors
Yoshiki Matoba
Mitsuo Naito
Assignee (at issue)
SEIKO INSTRUMENTS INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.