Granted Patent
Utility
US 6,497,483 · App. 10/091,616
Apparatus and method for objective measurement of optical systems using wavefront analysis
Inventors:
Rudolph W. Frey, James H. Burkhalter, Neil Zepkin, Edward Poppeliers, John Alfred Campin
Patented Case
View Patent ↗
Granted: Dec 24, 2002
Filed: Mar 6, 2002
Inventors
Rudolph W. Frey
James H. Burkhalter
Neil Zepkin
Edward Poppeliers
John Alfred Campin
Assignee (at issue)
Alcon, Inc
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.