IP Library › Granted Patent US 6,500,713
Granted Patent Utility
US 6,500,713 · App. 10/023,349

Method for repairing damage to charge trapping dielectric layer from bit line implantation

Inventors: Mark T. Ramsbey, Nicholas H. Tripsas, Arvind Halliyal
Patented Case View Patent ↗
Granted: Dec 31, 2002 Filed: Dec 20, 2001
Inventors
Mark T. Ramsbey
Nicholas H. Tripsas
Arvind Halliyal
Assignee (at issue)
Advanced Micro Devices, Inc.

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Quick Facts
Patent No.
US 6,500,713
App. No.
10/023,349
Filed
2001-12-20
Granted
2002-12-31
Kind
B1