Granted Patent
Utility
US 6,501,283 · App. 09/761,804
Circuit configuration for measuring the capacitance of structures in an integrated circuit
Inventors:
Jürgen Lindolf, Stefanie Schatt
Patented Case
View Patent ↗
Granted: Dec 31, 2002
Filed: Jan 16, 2001
Inventors
Jürgen Lindolf
Stefanie Schatt
Assignee (at issue)
Infineon Technologies AG
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.