IP Library Granted Patent US 6,501,343
Granted Patent Utility
US 6,501,343 · App. 09/805,668

Integrated circuit tester with high bandwidth probe assembly

Inventor: Charles A. Miller
Patented Case View Patent ↗
Granted: Dec 31, 2002 Filed: Mar 13, 2001
Inventor
Charles A. Miller
Assignee (at issue)
FormFactor, Inc.

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Quick Facts
Patent No.
US 6,501,343
App. No.
09/805,668
Filed
2001-03-13
Granted
2002-12-31
Kind
B2