Granted Patent
Utility
US 6,504,359 · App. 09/768,393
Method and device for testing electronic components
Inventor:
Jens Polney
Patented Case
View Patent ↗
Granted: Jan 7, 2003
Filed: Jan 24, 2001
Inventor
Jens Polney
Assignee (at issue)
Infineon Technologies AG
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.