Granted Patent
Utility
US 6,509,202 · App. 09/875,073
Method and system for qualifying an ONO layer in a semiconductor device
Inventor:
Hyeon-Seag Kim
Patented Case
View Patent ↗
Granted: Jan 21, 2003
Filed: Jun 5, 2001
Inventor
Hyeon-Seag Kim
Assignee (at issue)
Advanced Micro Devices, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.