Granted Patent
Utility
US 6,512,384 · App. 09/672,351
Method for fast and accurate determination of the minority carrier diffusion length from simultaneously measured surface photovoltages
Inventors:
Jacek Lagowski, Vladimir N. Faifer, Andrei Aleinikov
Patented Case
View Patent ↗
Granted: Jan 28, 2003
Filed: Sep 28, 2000
Inventors
Jacek Lagowski
Vladimir N. Faifer
Andrei Aleinikov
Assignee (at issue)
Semiconductor Diagnostics, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.