Granted Patent
Utility
US 6,515,495 · App. 09/793,353
Test structure in an integrated semiconductor
Inventor:
Frank Richter
Patented Case
View Patent ↗
Granted: Feb 4, 2003
Filed: Feb 26, 2001
Inventor
Frank Richter
Assignee (at issue)
Infineon Technologies AG
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.