Granted Patent
Utility
US 6,519,726 · App. 09/461,200
Semiconductor device and testing method of the same
Inventor:
Kayoko Shibata
Patented Case
View Patent ↗
Granted: Feb 11, 2003
Filed: Dec 15, 1999
Inventor
Kayoko Shibata
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.