Granted Patent
Utility
US 6,525,544 · App. 09/762,951
Method for predicting lifetime of insulating film and method for reliability testing of semiconductor device
Inventor:
Kenji Okada
Patented Case
View Patent ↗
Granted: Feb 25, 2003
Filed: Feb 15, 2001
Inventor
Kenji Okada
Assignee (at issue)
SUMITOMO ELECTRIC INDUSTRIES, LTD.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.