Granted Patent
Utility
US 6,525,555 · App. 09/573,489
Wafer-level burn-in and test
Inventors:
Igor Y. Khandros, David V. Pedersen
Patented Case
View Patent ↗
Granted: Feb 25, 2003
Filed: May 16, 2000
Inventors
Igor Y. Khandros
David V. Pedersen
Assignee (at issue)
FormFactor, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.