Granted Patent
Utility
US 6,530,148 · App. 09/579,718
Method for making a probe apparatus for testing integrated circuits
Inventor:
January Kister
Patented Case
View Patent ↗
Granted: Mar 11, 2003
Filed: May 26, 2000
Inventor
January Kister
Assignee (at issue)
Kulicke & Soffa Investments, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.