IP Library Granted Patent US 6,544,880
Granted Patent Utility
US 6,544,880 · App. 09/332,665

Method of improving copper interconnects of semiconductor devices for bonding

Inventor: Salman Akram
Patented Case View Patent ↗
Granted: Apr 8, 2003 Filed: Jun 14, 1999
Inventor
Salman Akram
Assignee (at issue)
Micron Technology, Inc.

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Quick Facts
Patent No.
US 6,544,880
App. No.
09/332,665
Filed
1999-06-14
Granted
2003-04-08
Kind
B1