Granted Patent
Utility
US 6,545,830 · App. 09/846,805
Disk drive storing test pattern in calibration sectors that are longer than user data sectors for zone parameter calibration
Inventors:
Albert W. Briggs, Phat T. Nguyen, Yoo H. Kim
Patented Case
View Patent ↗
Granted: Apr 8, 2003
Filed: Apr 30, 2001
Inventors
Albert W. Briggs
Phat T. Nguyen
Yoo H. Kim
Assignee (at issue)
WESTERN DIGITAL TECHNOLOGIES, INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.