IP Library Granted Patent US 6,548,821
Granted Patent Utility
US 6,548,821 · App. 09/549,501

Method and apparatus for inspecting substrates

Inventors: David Treves, Thomas A. O'Dell
Patented Case View Patent ↗
Granted: Apr 15, 2003 Filed: Apr 14, 2000
Inventors
David Treves
Thomas A. O'Dell
Assignee (at issue)
Komag, Inc.

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Quick Facts
Patent No.
US 6,548,821
App. No.
09/549,501
Filed
2000-04-14
Granted
2003-04-15
Kind
B1