Granted Patent
Utility
US 6,549,022 · App. 09/586,505
Apparatus and method for analyzing functional failures in integrated circuits
Inventors:
Edward I. Cole, Jr., Paiboon Tangyunyong, Charles F. Hawkins, Michael R. Bruce, Victoria J. Bruce, Rosalinda M. Ring
Patented Case
View Patent ↗
Granted: Apr 15, 2003
Filed: Jun 2, 2000
Inventors
Edward I. Cole, Jr.
Paiboon Tangyunyong
Charles F. Hawkins
Michael R. Bruce
Victoria J. Bruce
Rosalinda M. Ring
Assignees (at issue)
Sandia Corporation
Advanced Micro Devices, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.