Granted Patent
Utility
US 6,549,026 · App. 09/616,895
Apparatus and method for temperature control of IC device during test
Inventors:
Larry John Dibattista, Mark F. Malinoski, Tomoya Shitara
Patented Case
View Patent ↗
Granted: Apr 15, 2003
Filed: Jul 14, 2000
Inventors
Larry John Dibattista
Mark F. Malinoski
Tomoya Shitara
Assignee (at issue)
Delta Design, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.