Granted Patent
Utility
US 6,549,478 · App. 10/062,544
Scan register circuit for scanning data for determining failure in a semiconductor device
Inventor:
Masahito Suzuki
Patented Case
View Patent ↗
Granted: Apr 15, 2003
Filed: Feb 5, 2002
Inventor
Masahito Suzuki
Assignee (at issue)
Fujitsu Limited
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.