Granted Patent
Utility
US 6,551,835 · App. 09/670,110
Method and apparatus for thermally analyzing a material
Inventors:
Jürgen Schawe, Ingo Alig, Dirk Lellinger
Patented Case
View Patent ↗
Granted: Apr 22, 2003
Filed: Sep 26, 2000
Inventors
Jürgen Schawe
Ingo Alig
Dirk Lellinger
Assignee (at issue)
Mettler-Toledo GmbH
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.