Granted Patent
Utility
US 6,551,844 · App. 09/224,673
Test assembly including a test die for testing a semiconductor product die
Inventors:
Benjamin N. Eldridge, Igor Y. Khandros, David V. Pedersen, Ralph G. Whitten
Patented Case
View Patent ↗
Granted: Apr 22, 2003
Filed: Dec 31, 1998
Inventors
Benjamin N. Eldridge
Igor Y. Khandros
David V. Pedersen
Ralph G. Whitten
Assignee (at issue)
FormFactor, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.