IP Library Granted Patent US 6,556,491
Granted Patent Utility
US 6,556,491 · App. 09/871,932

Semiconductor storage device and method of testing the same

Inventors: Hidefumi Otsuka, Yuji Yamasaki
Patented Case View Patent ↗
Granted: Apr 29, 2003 Filed: Jun 1, 2001
Inventors
Hidefumi Otsuka
Yuji Yamasaki
Assignee (at issue)
SUMITOMO ELECTRIC INDUSTRIES, LTD.

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Quick Facts
Patent No.
US 6,556,491
App. No.
09/871,932
Filed
2001-06-01
Granted
2003-04-29
Kind
B2