Granted Patent
Utility
US 6,556,492 · App. 09/907,695
System for testing fast synchronous semiconductor circuits
Inventors:
Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jens Lüpke, Jochen Müller, Peter Pöchmüller, Michael Schittenhelm
Patented Case
View Patent ↗
Granted: Apr 29, 2003
Filed: Jul 18, 2001
Inventors
Wolfgang Ernst
Gunnar Krause
Justus Kuhn
Jens Lüpke
Jochen Müller
Peter Pöchmüller
Michael Schittenhelm
Assignee (at issue)
Infineon Technologies AG
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.