IP Library Granted Patent US 6,556,652
Granted Patent Utility
US 6,556,652 · App. 09/635,212

Measurement of critical dimensions using X-rays

Inventors: Isaac Mazor, Boris Yokhin, Amos Gvirtzman
Patented Case View Patent ↗
Granted: Apr 29, 2003 Filed: Aug 9, 2000
Inventors
Isaac Mazor
Boris Yokhin
Amos Gvirtzman
Assignee (at issue)
Jordan Valley Applied Radiation Ltd.

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Quick Facts
Patent No.
US 6,556,652
App. No.
09/635,212
Filed
2000-08-09
Granted
2003-04-29
Kind
B1