Granted Patent
Utility
US 6,556,934 · App. 09/916,713
Timing calibration method and semiconductor device testing apparatus having timing calibration function
Inventor:
Koichi Higashide
Patented Case
View Patent ↗
Granted: Apr 29, 2003
Filed: Jul 26, 2001
Inventor
Koichi Higashide
Assignee (at issue)
Advantest Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.