Granted Patent
Utility
US 6,559,669 · App. 09/820,715
Synchronous semiconductor device, and inspection system and method for the same
Inventors:
Hiroyuki Sugamoto, Hidetoshi Tanaka, Yasushige Tanaka
Patented Case
View Patent ↗
Granted: May 6, 2003
Filed: Mar 30, 2001
Inventors
Hiroyuki Sugamoto
Hidetoshi Tanaka
Yasushige Tanaka
Assignee (at issue)
Fujitsu Limited
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.