Granted Patent
Utility
US 6,560,730 · App. 09/507,234
Method and apparatus for testing a non-volatile memory array having a low number of output pins
Inventor:
Hung Quoc Nguyen
Patented Case
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Granted: May 6, 2003
Filed: Feb 18, 2000
Inventor
Hung Quoc Nguyen
Assignee (at issue)
Silicon Storage Technology, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.