Granted Patent
Utility
US 6,563,222 · App. 09/999,703
Method and apparatus for reducing electromigration in semiconductor interconnect lines
Inventors:
Takeshi Nogami, Sergey Lopatin
Patented Case
View Patent ↗
Granted: May 13, 2003
Filed: Oct 24, 2001
Inventors
Takeshi Nogami
Sergey Lopatin
Assignee (at issue)
Advanced Micro Devices, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.