IP Library Granted Patent US 6,563,321
Granted Patent Utility
US 6,563,321 · App. 09/852,177

Method and apparatus for detecting line-shorts by potential and temperature distribution

Inventor: Hiroaki Kikuchi
Patented Case View Patent ↗
Granted: May 13, 2003 Filed: May 10, 2001
Inventor
Hiroaki Kikuchi
Assignee (at issue)
NEC CORPORATION

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Quick Facts
Patent No.
US 6,563,321
App. No.
09/852,177
Filed
2001-05-10
Granted
2003-05-13
Kind
B2