Granted Patent
Utility
US 6,563,324 · App. 09/727,888
Semiconductor device image inspection utilizing rotation invariant scale invariant method
Inventor:
Sanjay Nichani
Patented Case
View Patent ↗
Granted: May 13, 2003
Filed: Nov 30, 2000
Inventor
Sanjay Nichani
Assignee (at issue)
Cognex Technology and Investment LLC
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.