Granted Patent
Utility
US 6,566,896 · App. 09/911,843
Semiconductor testing apparatus
Inventor:
Nobuaki Takeuchi
Patented Case
View Patent ↗
Granted: May 20, 2003
Filed: Jul 24, 2001
Inventor
Nobuaki Takeuchi
Assignee (at issue)
Ando Electric Co., Ltd.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.