Granted Patent
Utility
US 6,571,353 · App. 09/444,300
Fail information obtaining device and semiconductor memory tester using the same
Inventor:
Shinya Sato
Patented Case
View Patent ↗
Granted: May 27, 2003
Filed: Nov 22, 1999
Inventor
Shinya Sato
Assignee (at issue)
Advantest Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.