Granted Patent
Utility
US 6,574,159 · App. 10/137,352
Semiconductor memory device and testing method therefor
Inventors:
Shigeki Ohbayashi, Yoji Kashihara, Motomu Ukita
Patented Case
View Patent ↗
Granted: Jun 3, 2003
Filed: May 3, 2002
Inventors
Shigeki Ohbayashi
Yoji Kashihara
Motomu Ukita
Assignee (at issue)
MITSUBISHI ELECTRIC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.