Granted Patent
Utility
US 6,577,970 · App. 09/801,455
Method of determining a crystallographic quality of a material located on a substrate
Inventors:
Erik Cho Houge, John M. McIntosh, Larry E. Plew, Fred Stevie, Catherine Vartuli
Patented Case
View Patent ↗
Granted: Jun 10, 2003
Filed: Mar 8, 2001
Inventors
Erik Cho Houge
John M. McIntosh
Larry E. Plew
Fred Stevie
Catherine Vartuli
Assignee (at issue)
Agere Systems Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.