Granted Patent
Utility
US 6,583,810 · App. 09/076,007
Method and apparatus for measuring a diameter of a single crystal
Inventor:
Haruo Yamamura
Patented Case
View Patent ↗
Granted: Jun 24, 2003
Filed: May 12, 1998
Inventor
Haruo Yamamura
Assignee (at issue)
Sumitomo Sitix Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.