Granted Patent
Utility
US 6,584,598 · App. 09/904,463
Apparatus for optimized constraint characterization with degradation options and associated methods
Inventors:
Guruprasad Rao, E. Howick
Patented Case
View Patent ↗
Granted: Jun 24, 2003
Filed: Jul 13, 2001
Inventors
Guruprasad Rao
E. Howick
Assignee (at issue)
Silicon Metrics Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.