IP Library Granted Patent US 6,586,823
Granted Patent Utility
US 6,586,823 · App. 10/127,759

Semiconductor device that can have a defective bit found during or after packaging process repaired

Inventors: Ryuji Ohmura, Kazushi Sugiura
Patented Case View Patent ↗
Granted: Jul 1, 2003 Filed: Apr 23, 2002
Inventors
Ryuji Ohmura
Kazushi Sugiura
Assignees (at issue)
MITSUBISHI ELECTRIC CORPORATION
Ryoden Semiconductor System Engineering Corporation

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Quick Facts
Patent No.
US 6,586,823
App. No.
10/127,759
Filed
2002-04-23
Granted
2003-07-01
Kind
B2