Granted Patent
Utility
US 6,586,921 · App. 09/570,412
Method and circuit for testing DC parameters of circuit input and output nodes
Inventor:
Stephen K. Sunter
Patented Case
View Patent ↗
Granted: Jul 1, 2003
Filed: May 12, 2000
Inventor
Stephen K. Sunter
Assignee (at issue)
LogicVision, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.