Granted Patent
Utility
US 6,589,332 · App. 09/419,151
Method and system for measuring polycrystalline chunk size and distribution in the charge of a Czochralski process
Inventors:
John D. Holder, Steven M. Joslin, Hariprasad Sreedharamurthy, John Lhamon
Patented Case
View Patent ↗
Granted: Jul 8, 2003
Filed: Oct 15, 1999
Inventors
John D. Holder
Steven M. Joslin
Hariprasad Sreedharamurthy
John Lhamon
Assignee (at issue)
MEMC Electronic Materials, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.