Granted Patent
Utility
US 6,590,955 · App. 09/827,124
Open chamber-type X-ray analysis apparatus
Inventors:
Yoshiki Matoba, Mitsuo Naito, Koichi Tamura
Patented Case
View Patent ↗
Granted: Jul 8, 2003
Filed: Apr 5, 2001
Inventors
Yoshiki Matoba
Mitsuo Naito
Koichi Tamura
Assignee (at issue)
SEIKO INSTRUMENTS INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.