Granted Patent
Utility
US 6,596,992 · App. 10/017,123
Method of operating scanning probe microscope
Inventors:
Kazunori Ando, Kazutoshi Watanabe, Yoshiteru Shikakura, Masaki Tsuchihashi, Takehiro Yamaoka
Patented Case
View Patent ↗
Granted: Jul 22, 2003
Filed: Dec 14, 2001
Inventors
Kazunori Ando
Kazutoshi Watanabe
Yoshiteru Shikakura
Masaki Tsuchihashi
Takehiro Yamaoka
Assignee (at issue)
SEIKO INSTRUMENTS INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.