Granted Patent
Utility
US 6,603,685 · App. 09/778,261
Semiconductor integrated circuit device capable of ensuring reliability of transistor driving high voltage
Inventors:
Hideto Hidaka, Hiroaki Tanizaki, Tsukasa Ooishi
Patented Case
View Patent ↗
Granted: Aug 5, 2003
Filed: Feb 8, 2001
Inventors
Hideto Hidaka
Hiroaki Tanizaki
Tsukasa Ooishi
Assignees (at issue)
MITSUBISHI ELECTRIC CORPORATION
MITSUBISHI ELECTRIC ENGINEERING COMPANY, LIMITED
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.