IP Library › Granted Patent US 6,605,978
Granted Patent Utility
US 6,605,978 · App. 10/254,274

Method of forming a voltage detection device and structure therefor

Inventors: Josef Halamik, Frantisek Sukup
Patented Case View Patent ↗
Granted: Aug 12, 2003 Filed: Sep 25, 2002
Inventors
Josef Halamik
Frantisek Sukup
Assignee (at issue)
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC

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Quick Facts
Patent No.
US 6,605,978
App. No.
10/254,274
Filed
2002-09-25
Granted
2003-08-12
Kind
B1