IP Library › Granted Patent US 6,606,575
Granted Patent Utility
US 6,606,575 · App. 09/752,839

Cross-correlation timing calibration for wafer-level IC tester interconnect systems

Inventor: Charles A. Miller
Patented Case View Patent ↗
Granted: Aug 12, 2003 Filed: Dec 29, 2000
Inventor
Charles A. Miller
Assignee (at issue)
FormFactor, Inc.

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Quick Facts
Patent No.
US 6,606,575
App. No.
09/752,839
Filed
2000-12-29
Granted
2003-08-12
Kind
B2