IP Library Granted Patent US 6,607,978
Granted Patent Utility
US 6,607,978 · App. 10/212,739

Method of making a semiconductor device with alloy film between barrier metal and interconnect

Inventor: Yoshihisa Matsubara
Patented Case View Patent ↗
Granted: Aug 19, 2003 Filed: Aug 7, 2002
Inventor
Yoshihisa Matsubara
Assignee (at issue)
NEC Electronics Corporation

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Quick Facts
Patent No.
US 6,607,978
App. No.
10/212,739
Filed
2002-08-07
Granted
2003-08-19
Kind
B2