Granted Patent
Utility
US 6,608,690 · App. 10/007,124
Optical profilometry of additional-material deviations in a periodic grating
Inventors:
Xinhui Niu, Nickhil Jakatdar
Patented Case
View Patent ↗
Granted: Aug 19, 2003
Filed: Dec 4, 2001
Inventors
Xinhui Niu
Nickhil Jakatdar
Assignee (at issue)
TIMBRE TECHNOLOGIES, INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.