IP Library Granted Patent US 6,609,086
Granted Patent Utility
US 6,609,086 · App. 10/075,904

Profile refinement for integrated circuit metrology

Inventors: Junwei Bao, Srinivas Doddi, Nickhil Jakatdar, Vi Vuong
Patented Case View Patent ↗
Granted: Aug 19, 2003 Filed: Feb 12, 2002
Inventors
Junwei Bao
Srinivas Doddi
Nickhil Jakatdar
Vi Vuong
Assignee (at issue)
TIMBRE TECHNOLOGIES, INC.

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Quick Facts
Patent No.
US 6,609,086
App. No.
10/075,904
Filed
2002-02-12
Granted
2003-08-19
Kind
B1