Granted Patent
Utility
US 6,609,229 · App. 09/635,598
Method for automatically generating checkers for finding functional defects in a description of a circuit
Inventors:
Tai A. Ly, Jean-Charles Giomi, Kalyana C. Mulam, Paul Andrew Wilcox, David Lansing Dill, Paul II Estrada, Chian-min Richard Ho, Jing Chyuarn Lin, Robert Kristianto Mardjuki, Lawrence Curtis Widdoes, Jr., Ping Fai Yeung
Patented Case
View Patent ↗
Granted: Aug 19, 2003
Filed: Aug 9, 2000
Inventors
Tai A. Ly
Jean-Charles Giomi
Kalyana C. Mulam
Paul Andrew Wilcox
David Lansing Dill
Paul II Estrada
Chian-min Richard Ho
Jing Chyuarn Lin
Robert Kristianto Mardjuki
Lawrence Curtis Widdoes, Jr.
Ping Fai Yeung
Assignee (at issue)
O-In Design Automation, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.